AIP Digital Archive
Electrical Engineering, Measurement and Control Technology
We describe the construction of an ultrahigh vacuum chamber that incorporates variable-temperature scanning tunneling microscopy (STM), Fourier transform infrared reflection-absorption spectroscopy (FT-IRAS), Auger electron spectroscopy, low-energy electron diffraction, and temperature programmed desorption, for studying structure and reactivity at surfaces. The chamber and manipulator design enables in situ sample preparation and analysis, and rapid access to several surface-analytical techniques by rotation only. This eliminates sample inconsistencies due to ex situ preparation or the necessity to run parallel experiments. Inclusion of FT-IRAS allows us to characterize surface species and identify adsorbates during studies using STM. © 2002 American Institute of Physics.
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