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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 597-599 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report the three-dimensional imaging of the vibrational, solvent, orientational, and electronic relaxation in organic fluorescent samples at 200–500 nm spatial resolution. This is achieved in steady-state recordings by exciting the fluorophore with a femtosecond pulse and subsequent quenching with a time-delayed, redshifted femtosecond pulse through stimulated emission. Temporal resolution of 380 fs is solely determined by the pulse widths and is further reducible. Images of submicron structures revealing vibrational and solvent relaxation gradients are shown. Furthermore, we introduce contrast modes based on stimulated emission depletion and apply them to cellular imaging. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A concept to electrically control the scattering of light is introduced. The idea is to embed noble metal nanoparticles in an electro-optical material such as a liquid crystal in order to induce a spectral shift of the particle plasmon resonance by applying an electric field. Light scattering experiments on single gold nanoparticles show that spherically shaped nanoparticles become optically spheroidal when covered by an anisotropic liquid crystal. The two particle plasmon resonances of the optically spheroidal gold nanoparticles can be spectrally shifted by up to 50 meV when electric fields of more than 10 kV/cm are applied. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 393-395 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We demonstrate that an offset stimulated emission depletion (STED) beam breaks the diffraction barrier of fluorescence microscopy in both the lateral and the axial directions. A 2.5-fold axial reduction of the focal spot is accomplished through the ear-shaped lobes of the diffraction maximum of the STED beam. The effect of the minima and side maxima of the STED beam on the lateral and axial resolution is shown to be in remarkable agreement with theory. Conditions are given for which a regular STED beam reduces the axial extent of a confocal spot from 490±36 to 175±18 nm, and simultaneously from 183±12 to 70±8 nm along the direction of the offset. The latter establishes the lowest reported value in far-field fluorescence microscopy. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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