Polymer and Materials Science
Wiley InterScience Backfile Collection 1832-2000
The application of a wavelength dispersive x-ray spectrometer, instead of the conventional energy dispersive spectrometer, to particle induced x-ray emission analyses of GaAs is reported in this paper. The apparatus and its feasibility are described in detail through measurements of standard samples, Si, Mg, and B in GaAs. The conclusion is that the technique is a good tool for light elements analysis in heavy materials such as GaAs, but proper application of the technique necessitates carefully chosen samples.
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