AIP Digital Archive
Electrical Engineering, Measurement and Control Technology
We describe our cryogenic magnetic force microscope, operating between 4.2 and 300 K, in fields of 0–8 T. The system uses a fiber optic interferometer to measure cantilever deflections, permitting the tracking of the resonance frequency through the use of a phase locked loop. Piezoelectric positioners, capable of operation in high magnetic fields, perform in situ tip and fiber approaches. As an effective means of vibration isolation, we suspend the microscope from a soft bellows which attenuates vibrations by more than an order of magnitude. A detailed noise analysis indicates that although the microscope is thermally limited, the system frequency resolution is currently limited by the shot noise of the interferometer. © 2000 American Institute of Physics.
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