AIP Digital Archive
Electrical Engineering, Measurement and Control Technology
A new type of Kerr effect polarimeter, making use of four detectors, is described. The light is reflected at oblique incidence off each detector in turn, in such a way that the plane of incidence changes on each reflection. Since the reflections are polarization dependent, each detector signal depends on the Kerr rotation and, since the detector outputs can be normalized, this rotation may be obtained without the need of either a particularly stable laser source nor any type of modulation. The method thus provides a cheap alternative to more traditional Kerr techniques. We demonstrate its use in obtaining hysteresis loops for a thin film sample of CoO deposited on Co. © 2002 American Institute of Physics.
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