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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 1734-1740 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The knowledge of the detection efficiency of the microchannel plate is of upmost importance in many applications using this type of particle detector. However, few attempts have been made to measure the absolute value of the detection efficiency of microchannel plates. In this article, a new way of accurately measuring the absolute value of the detection efficiency is described. When particles hit the detector in the interchannel web of the microchannel plate, secondary electrons are generated. These secondary electrons can be returned to neighboring channels by means of an electric field applied at the front face of the detector. The resulting increase in the detection efficiency has been quantified using the absolute measurement of the detection efficiency. It is found that the value of the returning field has to be carefully set in order to prevent detection artifacts that may lead to a wrong estimation of the detection efficiency. In the best conditions, the detection efficiency increase reaches 40%. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 3127-3129 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Local magnification effects related to the presence of a second phase in three-dimensional atom probe have been investigated using a simulation of ion trajectories from the analyzed sample surface. Spherical precipitates containing only B atoms embedded in pure A solid solution were considered. The magnification was found to vary drastically from 0.5 to 2.0 times when the evaporation field of B (EB) was varied from 1.15 EA to 0.85 EA. The trajectories were found to overlap over distances close to 1 nm only when the reduced evaporation field (εB=EB/EA) is outside of a gap ranging from 0.9 to 1.1. Simulations indicate that the "measured" composition in the inner core of precipitates is not biased in this gap. This is also the case for particles which have a diameter larger than a critical value of 2 nm. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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