high-resolution electron microscopy
Springer Online Journal Archives 1860-2000
Electrical Engineering, Measurement and Control Technology
Abstract An overview is given of three techniques for preparing thin specimens of YBa2Cu3O7-δ for high-resolution electron microscopy: grinding, cleaving, and ion milling. Advantages and disadvantages are described, with particular attention to the artefacts that may be introduced by the different techniques. It is concluded that the most serious problem encountered during high-resolution electron microscopy studies is a surface-initiated decomposition leading to the ultimate degradation of the structure. This problem was found to be most pronounced in ion-milled specimens.
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