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  • 1
    ISSN: 1432-1246
    Keywords: Key words Occupational UV radiation ; Lifeguard ; Mountain guide ; Ski instructor ; Occupational disease
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Abstract Objective: Ultraviolet (UV) radiation is noted to be one of the most important risk factors for non-melanoma and melanoma skin cancers. The recent development of a spore film test chamber containing spores of Bacillus subtilis resulted in a new method of UV measurement with a spectral sensitivity profile similar to erythema-weighted data calculated from spectroradiometric measurements. Methods: The practical application of dosimeters was tested on 11 persons for 43 days, under different conditions of UV exposure in five different geographical regions. Four professional lifeguards at a public swimming pool carried dosimeters attached to their shoulders or to their caps, for 11 days. Three mountain guides attached dosimeters laterally to their heads on 27 different occasions of mountaineering activity in different mountain regions. Four ski instructors carried lateral head dosimeters during eight days of skiing in the Alps. Results: The life guards received daily UV exposures ranging from 3.6 to 9.5 minimal erythema doses (MED) (mean 5.9, SD ± 1.9). The mountain guides had personal daily UV exposures of from 4.4 to 17.1 MED (11.9 ± 3.9) and ski instructors from 2.8 to 8.8 MED (6.1 ± 1.8). Conclusions: Bacillus subtilis spore film dosimeters can be applied effectively for personal solar UV measurements of occupationally exposed persons, such as lifeguards, mountain guides and ski instructors. UV levels in these occupations exceed international limits of exposure.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 7051-7055 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The Be-enhanced formation of CdSe quantum dots in CdSe/ZnSe heterostructures grown by migration enhanced epitaxy on (001)GaAs substrates has been investigated using photoluminescence spectroscopy, x-ray techniques (diffraction and reflectometry), and transmission electron microscopy. Coverage of the ZnSe starting surface with a fractional monolayer of beryllium selenide leads to enhanced island formation well below the CdSe thickness of 0.6 monolayer corresponding to the onset of the CdSe-rich island formation in the Be-free structures. The effect of the fractional Be coverage is demonstrated by observation of sharp lines in the photoluminescence signal from patterned mesas with dimensions down to 60 nm, which is due to the emission from individual exciton localization sites attributed to quantum dots. X-ray diffraction and reflectometry measurements on CdSe/ZnSe short-period superlattices with the submonolayer CdSe insertions confirm an enhanced roughening of the CdSe layer morphology in the case of beryllium coverage. Cross-sectional transmission electron microscopy on the SLs with BeSe fractional monolayer exhibits Cd-induced stress modulation along the CdSe sheets with a lateral scale of ∼4 nm, that can also be interpreted in favor of the BeSe-nucleated CdSe-based quantum dots. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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