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  • 1995-1999  (3)
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  • 1
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The dopant-defect interaction in silicon-on-insulator (SOI) material is studied for Si film thicknesses ranging from 60 to 274 nm, with regards to (1) boron pileup and (2) defect-induced boron clustering. Results are obtained on boron-implanted samples and on molecular beam epitaxy-grown deposited-boron samples. The experimental results verify simulations predicting (a) boron pileup at both upper and lower interfaces of the Si film, and (b) no reduction of the boron clustering in SOI compared with bulk silicon. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Closed orbit feedback for the Advanced Photon Source (APS) storage ring employs unified global and local feedback systems for stabilization of particle and photon beams based on digital signal processing. Hardware and software aspects of the system will be described. In particular, we will discuss global and local orbit feedback algorithms, PID (proportional, integral, and derivative) control algorithm, application of digital signal processing to compensate for vacuum chamber eddy current effects, resolution of the interaction between global and local systems through decoupling, self-correction of the local bump closure error, user interface through the APS control system, and system performance in the frequency and time domains. The system hardware, including the digital signal processor (DSPs), is distributed in 20 VME crates around the ring, and the entire feedback system runs synchronously at 4-kHz sampling frequency in order to achieve a correction bandwidth exceeding 100 Hz. The required data sharing between the global and local feedback systems is facilitated via the use of fiber-optically networked reflective memories. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 3480-3482 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Electron backscatter diffraction (EBSD) using a scanning electron microscope has proven to be a valuable means for determining the crystal orientation of crystallites as small as ∼0.25 μm. However, it is still not widely used. One deterrent is the high cost of the image intensified video camera system that is commonly used to record the weak EBSD images produced on a phosphor screen. A much less expensive detector system has been devised using a microchannel plate (MCP) electron multiplier to provide the necessary gain in image intensity and a standard video camera to record the image. Excitation of the MCP by secondary electrons and low energy backscattered electron is prevented by a thin aluminum foil on the MCP front surface. The benefits and disadvantages of this approach to EBSD are presented, together with typical EBSD images obtained from it. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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