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  • 1995-1999  (2)
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  • 1
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Neutron powder diffraction can provide important structural information on hydrogenous compounds which are gases at ambient temperature. For high pressure studies, however, this technique has been seriously limited by the fact that it was impossible (a) to load such gases in large volume devices and (b) to compress them to elevated pressures above some 1 GPa. In this letter we show that, using a previously described pressure cell, a wide range of gaseous samples may be loaded and compressed to ∼10 GPa with standard tungsten carbide anvils. We illustrate the effectiveness of the technique with neutron powder diffraction data recently collected on deuterated ammonia ND3 phase IV, where accurate structural data were obtained after a few hours collection time. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 66 (1995), S. 1735-1737 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Full structural studies of condensed media under high pressure by neutron powder diffraction have been limited in practice to 2–3 GPa for several decades. This range is in general too small to allow a precise determination of the pressure dependence of atomic coordinates. As a consequence, almost no direct measurements exist, for example, of the pressure dependence of the bond lengths in H2 and the planetary ices. In this letter, a technique is presented which makes it possible to pressurize samples of 35 mm3 volume up to 30 GPa and to collect neutron diffraction patterns in a few hours by time-of-flight techniques. This method provides data which can be treated by Rietveld profile refinement methods, as demonstrated on a sample of D2O ice VII at 26 GPa. This represents a tenfold increase of the pressure range over which refinable neutron diffraction data can be obtained and should have a number of applications in such fields as fundamental physicochemistry, and geo- and planetary sciences. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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