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  • American Institute of Physics (AIP)  (1)
  • 1990-1994  (1)
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  • 1
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The capability for making ongoing characterization measurements of the spatial resolution and spectral reflectance of the Wölter x-ray optics used at Nova is essential for the interpretation of data taken with these imaging diagnostics. Equally important is an assessment of the long-term performance of grazing incidence x-ray optics used in the harsh environment of an ICF target chamber. We have designed and are currently building an off-line facility for such a characterization. The facility will consist of an x-ray source with specially designed pinhole-target foil array, the Wölter optics housing, monitoring and measuring detectors, a data acquisition system, and an in situ alignment system for rapid periodical verification. Each component of this lab will be discussed, along with possible initial results. This work was performed under the auspices of the U. S. Department of Energy by the Lawrence Livermore National Laboratory under contract No. W-7405-ENG-48.
    Type of Medium: Electronic Resource
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