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  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 1 (1979), S. 58-62 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: For approximately ten years there has existed a theoretically based concept of fundamental parameters for XRFA (quantitative X-ray fluorescence analysis). From a comparison of the differences specific for XRFA and XPS it can be learned that this concept is also applicable to XPS and allows quantitative analysis without reference samples. Additionally, the influence of an overlayer on analytical XPS results is discussed. The theoretical considerations are confirmed by a series of measurements performed on binary and ternary alloys of Ag/Au/Cu and the results are compared with those of earlier measurements with reference samples. An averaged absolute accuracy of approximately ±2 wt% has been found for both methods, but the advantage of an absolute method needs no further comment.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The present position regarding the preparation of junctions suitable for IETS investigation and the various doping procedures is outlined, and a comparison is drawn between IETS and other surface spectroscopies. A survey of the systems already studied of interest in the fields of surface chemistry, heterogeneous catalysis, analytical chemistry and environmental pollution monitoring, adhesion science, radiation damage, biological chemistry and electronic energy level studies is presented. The parameters thought to affect the development of this technique and some potential applications to corrosion inhibitors and metal protection, lubrication studies, solid-state devices and photochemical energy converters are considered.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Grimm-type glow discharge spectroscopy (GDS) was installed and evaluated as an emission spectroscopic source for the analysis of steel surfaces and for the determination of in-depth concentration profiles. In order to restrict the abnormal intensity fluctuation at the surface layer, which was observed during analysis of 300 Å of the sample surface layer, the third electrode was installed in the light source and a preliminary discharge technique was developed. The purpose of this preliminary discharge is to clean the sample surface and inner wall of the anode pipe, and to produce plasma in the discharge chamber in order to start the main discharge smoothly. By using GDS with this technique (modified GDS) the influence of abnormal fluctuation at the first stage of discharge was completely excluded and the unstable region of the intensity profile at the beginning of discharge was restricted to 10 Å or so. This modified GDS was applied to the analysis of the surface of box-annealed steel sheets and the determination of changes in composition with depth below the surface. The results were confirmed by an investigation of the in-depth analysis of the same samples previously conducted with an ion microprobe mass analyzer (IMMA), and this fact revealed the usefulness of modified GDS as a surface analyzer.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 1 (1979), S. 71-72 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A method is described which allows samples to be taken form the surface of electrical insulators which suffer electrical breakdown. The insulator does not have to be removed form its immediate environment. The contaminant is removed by ‘stripping’ it off with adhesive tape and the tape is subsequently examined by XPS.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 1 (1979), S. xi 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 1 (1979), S. 73-73 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Auger spectroscopy and X-ray photoelectron spectroscopy have evolved using different reference levels for electron energy measurement. Electron-excited Auger spectra are referenced to the vacuum level, and X-ray-excited Auger spectra are referenced to the Fermi level. This can cause confusion, especially when both are recorded in the N(E) mode in the same instrument.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 1 (1979), S. 74-74 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 1 (1979), S. xii 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 1 (1979), S. 75-81 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: C 1s, N 1s and O 1s core spectra were measured for well-cured polyimide films of poly(N,N′-(p,p′-oxydiphenylene)promellitimide), and of poly(p,p′-oxybis(phenylene)-3,3′,4,4′-benzophenonetetracarboxylimide). Resolvable were: multiple C 1s, two N 1s and two O 1s components. A carbonyl deficiency not due to X-ray-induced decarboxylation was detected. Approximately 45% of the surface carbon matrix was found to be comprised of partially oxidized, non-carbonyl-containing moieties of unknown origin. C 1s chemical shift behavior showed that imide bond formation does occur on curing; the imidization reaction in the surface region is incomplete (or altered) based on the changes in the O 1s and N 1s data with increasing temperature of curing. A surface chemical structure inconsistent with the bulk structural formula is observed.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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