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    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 30 (1997), S. 1008-1015 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The peak profiles of standard reference materials have been investigated with energy-dispersive X-ray diffraction at a synchrotron source. Keeping the detector dead time below 2%, the peak profiles were essentially pure Gaussians independent of energy in the range investigated. Plastic deformation of ductile f.c.c.-based materials (Cu3Au and Au) leads to increased Lorentzian contributions to the peak profiles. A single-line profile analysis was performed to obtain estimates of size and strain; reasonable values were found.
    Type of Medium: Electronic Resource
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