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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 279-281 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A method of measuring magnetic dissipation on a sub-100 nm scale is presented. This technique relies on measuring changes in the damping of the oscillating tip in a magnetic force microscope (MFM). Damping contrast is strongly correlated with micromagnetic structure and in the case of NiFe, is in quantitative agreement with magnetoelastic losses in the sample. On recording tracks, large damping signals are observed. This has direct consequences on the interpretation of traditional MFM images acquired with detectors that convolute frequency and damping information. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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