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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 517-521 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Time-resolved hot-stage transmission optical microscopy is used to characterize the nucleation and growth kinetics of amorphous GeTe thin-film crystallization. This technique provides experimental measurements of the fraction crystallized, the number of crystallites, and the crystallite size as a function of annealing time and temperature. The fraction-crystallized data are modelled using the Johnson–Mehl–Avrami formalism to give an Avrami exponent of 4, consistent with previous measurements via time-resolved reflection/transmission methods. Microstructural measurements provide sufficient data to deconvolute the individual contributions of nucleation and growth to this exponent. This work shows that crystallization of these films proceeds by nucleation at an increasing rate due to transient effects with isotropic two-dimensional growth in the film plane. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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